30 Pc Specimen Surface Roughness Comparator Kit, Composite Exterior Comparison Sample Block, Pocket Gauge Set, for Turning, Milling, Grinding, Polishing Inspection

Welcome to my shop~ Happy shopping! (▔▽▔~) Product Specifications: Product Name: Surface Roughness Comparison Sample Block Material: High-quality carbon structural steel Specifications: Flat milling, end milling, lathe, flat grinding, grinding, external grinding Configuration: 6 sets of sample blocks Packaging: Notebook format Packaging Contents: 1 x Surface Roughness Comparison Sample Block

• 【Multiple Processes】This surface roughness comparator measures roughness for six different machining processes (horizontal milling, end milling, turning, flat grinding, surface lapping, and cylindrical grinding). It can perform a wide range of tasks, including measuring different surface types and inspecting various textures.
• 【Excellent Measurement Accuracy】This surface roughness comparator comes standard with 30 samples of varying roughness grades. This provides a wide range of options for quickly identifying and comparing various surface characteristics, ensuring your products meet the highest standards.
• 【Stable and Durable】These surface roughness comparators are made of carbon structural steel, a durable, corrosion-resistant, and non-deformable material. An oil film fully protects them from rust. You can be confident of long-term, repeated use, ensuring accuracy and reliability.
• 【Easy to Use】The surface roughness standard set features clearly labeled models and one-to-one matching samples, making comparison, inspection, and identification easy. Whether you're a student or an experienced engineer, operation and comparison are simple, meeting your needs.
• 【Widely Used】Composite pocket gauge sets are not only suitable for surface roughness measurement, quality assurance, and instrument calibration, but can also serve as a visual teaching tool for mechanical engineering majors in universities, meeting the diverse application needs of various industries and fields.